Search results
IEEE Transactions on Electron Devices > 2017 > 64 > 10 > 3991 - 3997
IEEE Transactions on Electron Devices > 2017 > 64 > 5 > 2099 - 2105
IEEE Design & Test > 2016 > 33 > 3 > 37 - 45
IEEE Electron Device Letters > 2016 > 37 > 2 > 130 - 133
IEEE Transactions on Electron Devices > 2015 > 62 > 11 > 3876 - 3881
IEEE Electron Device Letters > 2015 > 36 > 10 > 991 - 993
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2015 > 23 > 7 > 1308 - 1321
IEEE Transactions on Electron Devices > 2015 > 62 > 6 > 1811 - 1818
2015 IEEE International Reliability Physics Symposium > 5C.6.1 - 5C.6.5
IEEE Transactions on Electron Devices > 2015 > 62 > 2 > 485 - 492