Search results
IEEE Electron Device Letters > 2017 > 38 > 1 > 36 - 39
2013 IEEE International Reliability Physics Symposium (IRPS) > MY.1.1 - MY.1.3
IEEE Transactions on Electron Devices > 2012 > 59 > 9 > 2331 - 2337
IEEE Transactions on Electron Devices > 2011 > 58 > 1 > 11 - 16
IEEE Transactions on Electron Devices > 2011 > 58 > 8 > 2302 - 2309
IEEE Journal of Solid-State Circuits > 2010 > 45 > 10 > 2165 - 2172