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IEEE Transactions on Device and Materials Reliability > 2017 > 17 > 3 > 507 - 513
2011 International Reliability Physics Symposium > HV.1.1 - HV.1.4
2010 International Electron Devices Meeting > 4.3.1 - 4.3.4
2010 IEEE International Reliability Physics Symposium > 1006 - 1007