Search results for: M. Miura-Mattausch
Microelectronics Reliability > 2018 > 80 > C > 164-175
IEEE Transactions on Device and Materials Reliability > 2017 > 17 > 1 > 52 - 58
IEEE Transactions on Electron Devices > 2016 > 63 > 5 > 2057 - 2065
Microelectronics Reliability > 2018 > 80 > C > 164-175
IEEE Transactions on Device and Materials Reliability > 2017 > 17 > 1 > 52 - 58
IEEE Transactions on Electron Devices > 2016 > 63 > 5 > 2057 - 2065