Search results for: Gilson I. Wirth
Solid-State Electronics > 2017 > 137 > C > 16-21
IEEE Transactions on Device and Materials Reliability > 2017 > 17 > 3 > 507 - 513
IEEE Transactions on Electron Devices > 2017 > 64 > 8 > 3331 - 3336
IEEE Transactions on Electron Devices > 2017 > 64 > 7 > 2919 - 2926
IEEE Transactions on Electron Devices > 2016 > 63 > 9 > 3683 - 3692
Microelectronic Engineering > 2016 > 159 > C > 155-158
IFIP — The International Federation for Information Processing > VLSI-SoC: Advanced Topics on Systems on a Chip > 1-24
Journal of Computational Electronics > 2015 > 14 > 1 > 15-20
2014 IEEE International Electron Devices Meeting > 35.2.1 - 35.2.4
Microelectronics Reliability > 2011 > 51 > 12 > 2341-2350
IEEE Transactions on Electron Devices > 2011 > 58 > 8 > 2743 - 2751
Physica A: Statistical Mechanics and its Applications > 2010 > 389 > 14 > 2687-2699
Applied Mathematical Modelling > 2010 > 34 > 4 > 968-977
Journal of Computational Electronics > 2010 > 9 > 3-4 > 114-121
Analog Integrated Circuits and Signal Processing > 2010 > 62 > 2 > 141-157
Microelectronics Reliability > 2009 > 49 > 9-11 > 1064-1069
Microelectronics Reliability > 2008 > 48 > 1 > 29-36