Search results for: H. Kikuchihara
Microelectronics Reliability > 2018 > 80 > C > 164-175
IEEE Transactions on Electron Devices > 2011 > 58 > 7 > 2072 - 2080
IEEE Transactions on Electron Devices > 2010 > 57 > 10 > 2671 - 2678
Microelectronics Reliability > 2018 > 80 > C > 164-175
IEEE Transactions on Electron Devices > 2011 > 58 > 7 > 2072 - 2080
IEEE Transactions on Electron Devices > 2010 > 57 > 10 > 2671 - 2678