Search results for: N. Labat
Microelectronics Reliability > 2017 > 76-77 > C > 350-356
IEEE Transactions on Electron Devices > 2017 > 64 > 4 > 1548 - 1553
Microelectronics Reliability > 2016 > 64 > C > 594-598
Microelectronics Reliability > 2015 > 55 > 9-10 > 1741-1745
Microelectronics Reliability > 2015 > 55 > 9-10 > 1672-1676
Microelectronics Reliability > 2013 > 53 > 9-11 > 1450-1455
Microelectronics Reliability > 2013 > 53 > 9-11 > 1491-1495
Microelectronics Reliability > 2013 > 53 > 9-11 > 1375-1380
Microelectronics Reliability > 2012 > 52 > 9-10 > 2184-2187
Microelectronics Reliability > 2011 > 51 > 9-11 > 1730-1735
Microelectronics Reliability > 2011 > 51 > 9-11 > 1845-1849
Microelectronics Reliability > 2010 > 50 > 9-11 > 1520-1522