Search results for: Y. Deshayes
Microelectronics Reliability > 2017 > 76-77 > C > 579-583
Microelectronics Reliability > 2015 > 55 > 9-10 > 1741-1745
Microelectronics Reliability > 2013 > 53 > 9-11 > 1514-1518
IEEE Transactions on Device and Materials Reliability > 2011 > 11 > 2 > 303 - 311
Microelectronics Reliability > 2010 > 50 > 9-11 > 1568-1573
IEEE Transactions on Device and Materials Reliability > 2010 > 10 > 1 > 164 - 170
Microelectronics Reliability > 2008 > 48 > 8-9 > 1354-1360
Microelectronics Reliability > 2008 > 48 > 8-9 > 1202-1207
Optics and Laser Technology > 2008 > 40 > 4 > 589-601
Ieee transactions on components and packaging technologies > 2008 > 31 > 4 > 759 - 766
Microelectronics Reliability > 2005 > 45 > 9-11 > 1593-1599
Measurement > 2003 > 34 > 2 > 157-178
Microelectronics Reliability > 2003 > 43 > 7 > 1137-1144
Microelectronics Reliability > 2003 > 43 > 7 > 1125-1136