Search results for: N. Malbert
Microelectronics Reliability > 2017 > 76-77 > C > 350-356
Microelectronics Reliability > 2016 > 64 > C > 594-598
Microelectronics Reliability > 2015 > 55 > 9-10 > 1672-1676
Microelectronics Reliability > 2013 > 53 > 9-11 > 1450-1455
Microelectronics Reliability > 2013 > 53 > 9-11 > 1491-1495
Microelectronics Reliability > 2013 > 53 > 9-11 > 1375-1380
Microelectronics Reliability > 2012 > 52 > 9-10 > 2184-2187
IEEE Electron Device Letters > 2011 > 32 > 2 > 119 - 121
Microelectronics Reliability > 2010 > 50 > 9-11 > 1520-1522
Microelectronics Reliability > 2009 > 49 > 9-11 > 1216-1221
Microelectronics Reliability > 2008 > 48 > 8-9 > 1366-1369
Microelectronics Reliability > 2007 > 47 > 9-11 > 1630-1633