Search results for: D. Carisetti
IEEE Transactions on Electron Devices > 2017 > 64 > 4 > 1548 - 1553
Microelectronics Reliability > 2013 > 53 > 9-11 > 1450-1455
Microelectronics Reliability > 2013 > 53 > 9-11 > 1491-1495
Microelectronics Reliability > 2013 > 53 > 9-11 > 1375-1380
Microelectronics Reliability > 2012 > 52 > 9-10 > 2184-2187
Microelectronics Reliability > 2010 > 50 > 9-11 > 1520-1522
Microelectronics Reliability > 2008 > 48 > 8-9 > 1366-1369
Microelectronics Reliability > 2007 > 47 > 9-11 > 1630-1633
Electronics Letters > 1990 > 26 > 13 > 919 - 921