Search results
IEEE Transactions on Device and Materials Reliability > 2017 > 17 > 4 > 780 - 784
IEEE Transactions on Electron Devices > 2017 > 64 > 12 > 4861 - 4867
IEEE Electron Device Letters > 2017 > 38 > 8 > 1012 - 1014
IEEE Transactions on Electron Devices > 2017 > 64 > 8 > 3275 - 3281
IEEE Electron Device Letters > 2017 > 38 > 6 > 705 - 707
IEEE Transactions on Device and Materials Reliability > 2017 > 17 > 2 > 422 - 431
2017 IEEE International Reliability Physics Symposium (IRPS) > XT-6.1 - XT-6.4
2017 IEEE International Reliability Physics Symposium (IRPS) > FA-3.1 - FA-3.4
IEEE Transactions on Electron Devices > 2017 > 64 > 3 > 923 - 929
IEEE Transactions on Electron Devices > 2017 > 64 > 2 > 634 - 637
IEEE Transactions on Electron Devices > 2017 > 64 > 1 > 37 - 44
IEEE Transactions on Device and Materials Reliability > 2016 > 16 > 4 > 610 - 616
IEEE Transactions on Electron Devices > 2016 > 63 > 12 > 5068 - 5071