Search results for: Niccolo Rinaldi
Microelectronics Reliability > 2018 > 87 > C > 222-231
Microelectronics Reliability > 2018 > 87 > C > 194-205
Microelectronics Reliability > 2017 > 79 > C > 371-379
Microelectronics Reliability > 2017 > 79 > C > 361-370
Microelectronics Reliability > 2017 > 78 > C > 233-242
Proceedings of the IEEE > 2017 > 105 > 6 > 1035 - 1050
IEEE Transactions on Electron Devices > 2017 > 64 > 3 > 923 - 929
Microelectronics Reliability > 2016 > 67 > C > 38-45
IEEE Transactions on Electron Devices > 2016 > 63 > 7 > 2691 - 2699
Lecture Notes in Computer Science > Computational Science - ICCS 2004 > Workshop on Simulation and Modeling of 3D Integrated Circuits > 1021-1028
Microelectronics Journal > 2015 > 46 > 12 Part A > 1129-1137