Wyniki wyszukiwania
2012 IEEE International Reliability Physics Symposium (IRPS) > 2F.4.1 - 2F.4.6
2012 IEEE International Reliability Physics Symposium (IRPS) > XT.13.1 - XT.13.4
IEEE Transactions on Electron Devices > 2012 > 59 > 11 > 3078 - 3083
IEEE Electron Device Letters > 2012 > 33 > 9 > 1285 - 1287
2011 International Reliability Physics Symposium > 6A.4.1 - 6A.4.6
IEEE Electron Device Letters > 2011 > 32 > 3 > 294 - 296
IEEE Electron Device Letters > 2011 > 32 > 5 > 584 - 586
IEEE Transactions on Electron Devices > 2011 > 58 > 2 > 567 - 571
IEEE Electron Device Letters > 2011 > 32 > 9 > 1176 - 1178
IEEE Electron Device Letters > 2010 > 31 > 11 > 1211 - 1213
IEEE Electron Device Letters > 2010 > 31 > 8 > 788 - 790
IEEE Electron Device Letters > 2010 > 31 > 8 > 779 - 781