Wyniki wyszukiwania
IEEE Electron Device Letters > 2016 > 37 > 11 > 1415 - 1417
IEEE Transactions on Electron Devices > 2016 > 63 > 4 > 1486 - 1494
IEEE Transactions on Nuclear Science > 2015 > 62 > 6-1 > 2423 - 2430
IEEE Transactions on Electron Devices > 2011 > 58 > 5 > 1499 - 1507
IEEE Electron Device Letters > 2008 > 29 > 4 > 287 - 289
IEEE Transactions on Device and Materials Reliability > 2008 > 8 > 2 > 289 - 296
IEEE Transactions on Device and Materials Reliability > 2008 > 8 > 2 > 332 - 343