Wyniki wyszukiwania
2016 IEEE International Conference on Dielectrics (ICD) > 2 > 1065 - 1068
IEEE Electron Device Letters > 2016 > 37 > 7 > 855 - 858
2013 IEEE International Reliability Physics Symposium (IRPS) > EL.5.1 - EL.5.5
IEEE Transactions on Electron Devices > 2013 > 60 > 3 > 1268 - 1271
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2013 > 21 > 2 > 250 - 258
2012 IEEE International Reliability Physics Symposium (IRPS) > XT.5.1 - XT.5.6
IEEE Transactions on Semiconductor Manufacturing > 2012 > 25 > 3 > 303 - 309
IEEE Transactions on Device and Materials Reliability > 2012 > 12 > 1 > 10 - 14
IEEE Electron Device Letters > 2012 > 33 > 7 > 946 - 948
IEEE Journal of Solid-State Circuits > 2012 > 47 > 9 > 2258 - 2265
IEEE Sensors Journal > 2012 > 12 > 6 > 2278 - 2286
IEEE Electron Device Letters > 2012 > 33 > 2 > 191 - 193