Search results for: J. Postel-Pellerin
Microelectronics Reliability > 2016 > 64 > C > 36-41
2016 IEEE International Conference on Dielectrics (ICD) > 2 > 1065 - 1068
2016 IEEE International Reliability Physics Symposium (IRPS) > 7B-4-1 - 7B-4-7
Solid State Electronics > 2014 > 101 > Complete > 79-84
Microelectronics Reliability > 2014 > 54 > 9-10 > 2262-2265
Microelectronics Reliability > 2013 > 53 > 9-11 > 1218-1223
Solid State Electronics > 2013 > 79 > Complete > 210-217
Solid State Electronics > 2012 > 78 > Complete > 80-86
CAS 2012 (International Semiconductor Conference) > 2 > 377 - 380
CAS 2012 (International Semiconductor Conference) > 1 > 103 - 106