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IEEE Transactions on Nuclear Science > 2017 > 64 > 10 > 2633 - 2638
IEEE Transactions on Electron Devices > 2017 > 64 > 10 > 4018 - 4024
IEEE Transactions on Device and Materials Reliability > 2017 > 17 > 3 > 507 - 513
IEEE Transactions on Power Electronics > 2017 > 32 > 6 > 4776 - 4784
2017 IEEE International Reliability Physics Symposium (IRPS) > 2A-4.1 - 2A-4.4
IEEE Transactions on Electron Devices > 2016 > 63 > 12 > 4913 - 4918
IEEE Transactions on Computer-Aided Design of Integrated Circuits and... > 2016 > 35 > 8 > 1243 - 1254
IEEE Electron Device Letters > 2016 > 37 > 8 > 1055 - 1058
2016 IEEE International Reliability Physics Symposium (IRPS) > 5C-2-1 - 5C-2-5
2016 IEEE International Reliability Physics Symposium (IRPS) > ES-1-1 - ES-1-8
2016 IEEE International Reliability Physics Symposium (IRPS) > XT-7-1 - XT-7-5
IEEE Transactions on Nuclear Science > 2016 > 63 > 2-3 > 1268 - 1275
IEEE Transactions on Device and Materials Reliability > 2016 > 16 > 1 > 98 - 100
IEEE Journal of the Electron Devices Society > 2016 > 4 > 2 > 42 - 49
IEEE Transactions on Electron Devices > 2015 > 62 > 9 > 2940 - 2944