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IEEE Transactions on Electron Devices > 2016 > 63 > 6 > 2384 - 2390
IEEE Electron Device Letters > 2014 > 35 > 9 > 951 - 953
IEEE Transactions on Electron Devices > 2014 > 61 > 3 > 801 - 805
IEEE Electron Device Letters > 2014 > 35 > 2 > 220 - 222
2013 IEEE International Reliability Physics Symposium (IRPS) > 4A.5.1 - 4A.5.5
IEEE Electron Device Letters > 2012 > 33 > 7 > 940 - 942
IEEE Transactions on Circuits and Systems I: Regular Papers > 2012 > 59 > 8 > 1635 - 1643
IEEE Transactions on Electron Devices > 2012 > 59 > 10 > 2603 - 2609
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2012 > 20 > 5 > 855 - 864