Search results for: L. Theolier
Microelectronics Reliability > 2016 > 64 > C > 409-414
Microelectronics Reliability > 2015 > 55 > 9-10 > 1961-1965
Microelectronics Reliability > 2015 > 55 > 9-10 > 1981-1987
Microelectronics Reliability > 2015 > 55 > 9-10 > 2017-2021
Microelectronics Reliability > 2013 > 53 > 9-11 > 1719-1724
IEEE Electron Device Letters > 2009 > 30 > 6 > 687 - 689
Microsystem Technologies > 2009 > 15 > 9 > 1395-1400
Microelectronics Journal > 2008 > 39 > 6 > 914-921