Search results for: Lars-Ake Ragnarsson
2017 IEEE International Reliability Physics Symposium (IRPS) > FA-5.1 - FA-5.4
IEEE Transactions on Device and Materials Reliability > 2014 > 14 > 1 > 408 - 412
IEEE Electron Device Letters > 2014 > 35 > 12 > 1179 - 1181
IEEE Transactions on Electron Devices > 2014 > 61 > 11 > 3632 - 3638
IEEE Transactions on Electron Devices > 2014 > 61 > 9 > 3139 - 3144
IEEE Transactions on Electron Devices > 2013 > 60 > 9 > 2960 - 2962
IEEE Electron Device Letters > 2013 > 34 > 5 > 593 - 595
IEEE Transactions on Electron Devices > 2012 > 59 > 8 > 2042 - 2048
IEEE Transactions on Electron Devices > 2012 > 59 > 7 > 1856 - 1862
IEEE Transactions on Electron Devices > 2012 > 59 > 11 > 3124 - 3126
Solid State Electronics > 2011 > 63 > 1 > 5-7
Solid State Electronics > 2011 > 62 > 1 > 67-71
Microelectronics Reliability > 2011 > 51 > 6 > 1118-1122
IEEE Transactions on Electron Devices > 2011 > 58 > 10 > 3342 - 3349