Search results for: Robin Degraeve
Journal of Computational Electronics > 2017 > 16 > 4 > 1011-1016
2017 IEEE International Reliability Physics Symposium (IRPS) > 5A-5.1 - 5A-5.6
IEEE Transactions on Nuclear Science > 2014 > 61 > 6-1 > 2972 - 2978
IEEE Transactions on Electron Devices > 2014 > 61 > 5 > 1501 - 1507
IEEE Transactions on Electron Devices > 2014 > 61 > 9 > 3139 - 3144
IEEE Transactions on Electron Devices > 2014 > 61 > 5 > 1299 - 1306
Computational Materials Science > 2014 > 81 > C > 178-183
2013 IEEE International Electron Devices Meeting > 10.1.1 - 10.1.4
Microelectronic Engineering > 2013 > 109 > Complete > 105-108
2013 5th IEEE International Memory Workshop > 159 - 162
IEEE Transactions on Electron Devices > 2013 > 60 > 12 > 4002 - 4007
IEEE Transactions on Electron Devices > 2013 > 60 > 7 > 2261 - 2267
IEEE Transactions on Electron Devices > 2013 > 60 > 3 > 1114 - 1121
IEEE Electron Device Letters > 2013 > 34 > 5 > 614 - 616
IEEE Electron Device Letters > 2013 > 34 > 5 > 626 - 628
2012 International Electron Devices Meeting > 20.3.1 - 20.3.4