Search results for: Thomas Kauerauf
2017 IEEE International Reliability Physics Symposium (IRPS) > XT-6.1 - XT-6.4
2017 IEEE International Reliability Physics Symposium (IRPS) > DG-6.1 - DG-6.3
2016 IEEE International Electron Devices Meeting (IEDM) > 31.2.1 - 31.2.4
IEEE Transactions on Device and Materials Reliability > 2014 > 14 > 1 > 408 - 412
IEEE Transactions on Electron Devices > 2014 > 61 > 8 > 2935 - 2943
IEEE Electron Device Letters > 2013 > 34 > 10 > 1211 - 1213
IEEE Transactions on Electron Devices > 2013 > 60 > 12 > 4002 - 4007
IEEE Electron Device Letters > 2013 > 34 > 5 > 593 - 595
IEEE Transactions on Electron Devices > 2013 > 60 > 1 > 405 - 412
IEEE Transactions on Electron Devices > 2012 > 59 > 8 > 2042 - 2048
IEEE Transactions on Device and Materials Reliability > 2012 > 12 > 1 > 166 - 170
Thin Solid Films > 2011 > 520 > 1 > 662-666
Solid State Electronics > 2011 > 63 > 1 > 5-7
Microelectronic Engineering > 2011 > 88 > 7 > 1365-1372
Microelectronics Reliability > 2011 > 51 > 6 > 1118-1122
IEEE Transactions on Electron Devices > 2011 > 58 > 10 > 3342 - 3349
IEEE Electron Device Letters > 2011 > 32 > 3 > 252 - 254
IEEE Electron Device Letters > 2010 > 31 > 6 > 606 - 608