Search results for: Ben Kaczer
Advanced Materials > 34 > 48 > n/a - n/a
Advanced Functional Materials > 31 > 23 > n/a - n/a
IEEE Transactions on Electron Devices > 2017 > 64 > 10 > 4011 - 4017
IEEE Transactions on Electron Devices > 2017 > 64 > 6 > 2478 - 2484
2017 IEEE International Reliability Physics Symposium (IRPS) > XT-8.1 - XT-8.6
2017 IEEE International Reliability Physics Symposium (IRPS) > 5C-4.1 - 5C-4.7
IEEE Transactions on Electron Devices > 2017 > 64 > 4 > 1467 - 1473
IEEE Electron Device Letters > 2017 > 38 > 3 > 371 - 374
IEEE Electron Device Letters > 2017 > 38 > 2 > 160 - 163
IEEE Electron Device Letters > 2016 > 37 > 10 > 1280 - 1283
IEEE Transactions on Electron Devices > 2016 > 63 > 9 > 3642 - 3648
IEEE Electron Device Letters > 2016 > 37 > 9 > 1211 - 1214
physica status solidi (RRL) – Rapid Research Letters > 10 > 5 > 420 - 425
2016 IEEE International Reliability Physics Symposium (IRPS) > CR-1-1 - CR-1-6
2016 IEEE International Reliability Physics Symposium (IRPS) > XT-10-1 - XT-10-6
2016 IEEE International Reliability Physics Symposium (IRPS) > 4B-4-1 - 4B-4-6