Search results for: S. Ortolland
2017 IEEE International Reliability Physics Symposium (IRPS) > XT-7.1 - XT-7.6
2017 IEEE International Reliability Physics Symposium (IRPS) > 4C-4.1 - 4C-4.7
Solid-State Electronics > 2017 > 128 > C > 72-79
IEEE Transactions on Semiconductor Manufacturing > 2008 > 21 > 2 > 132 - 139
Materials Science & Engineering B > 1999 > 66 > 1-3 > 106-110
Materials Science & Engineering B > 1999 > 61-62 > Complete > 411-414
Materials Science & Engineering B > 1997 > 46 > 1-3 > 210-217