Search results for: F. Zhang
IEEE Electron Device Letters > 2014 > 35 > 2 > 160 - 162
2013 IEEE International Electron Devices Meeting > 2.5.1 - 2.5.4
IEEE Transactions on Device and Materials Reliability > 2012 > 12 > 2 > 478 - 481
IEEE Transactions on Electron Devices > 2012 > 59 > 7 > 1906 - 1914
IEEE Electron Device Letters > 2012 > 33 > 3 > 339 - 341