Search results for: W. Goes
Microelectronics Reliability > 2018 > 87 > C > 286-320
IEEE Transactions on Computational Intelligence and AI in Games > 2017 > 9 > 2 > 204 - 209
IEEE Transactions on Electron Devices > 2017 > 64 > 5 > 2099 - 2105
IEEE Transactions on Electron Devices > 2017 > 64 > 5 > 2092 - 2098
Concurrency and Computation: Practice and Experience > 29 > 8 > n/a - n/a
Solid-State Electronics > 2016 > 125 > C > 52-62
Lecture Notes in Computer Science > Parallel and Distributed Processing and Applications > Session 1C: Distributed Algorithms and Systems > 132-138
2016 IEEE International Reliability Physics Symposium (IRPS) > 5A-2-1 - 5A-2-8
2016 IEEE International Reliability Physics Symposium (IRPS) > XT-2-1 - XT-2-6
2015 IEEE International Electron Devices Meeting (IEDM) > 20.1.1 - 20.1.4
Concurrency and Computation: Practice and Experience > 27 > 17 > 4938 - 4953
2015 IEEE International Reliability Physics Symposium > 5A.3.1 - 5A.3.8
2014 IEEE International Electron Devices Meeting > 21.1.1 - 21.1.4