Search results for: G. Rzepa
Microelectronics Reliability > 2018 > 87 > C > 286-320
IEEE Transactions on Electron Devices > 2017 > 64 > 5 > 2099 - 2105
IEEE Transactions on Electron Devices > 2017 > 64 > 5 > 2092 - 2098
2017 IEEE International Reliability Physics Symposium (IRPS) > 2D-6.1 - 2D-6.7
2017 IEEE International Reliability Physics Symposium (IRPS) > XT-11.1 - XT-11.6
2017 IEEE International Reliability Physics Symposium (IRPS) > 6A-2.1 - 6A-2.6
2016 IEEE International Electron Devices Meeting (IEDM) > 30.7.1 - 30.7.4
Solid-State Electronics > 2016 > 125 > C > 52-62
2016 IEEE International Reliability Physics Symposium (IRPS) > 5A-2-1 - 5A-2-8
2016 IEEE International Reliability Physics Symposium (IRPS) > 4C-4-1 - 4C-4-6
2016 IEEE International Reliability Physics Symposium (IRPS) > XT-2-1 - XT-2-6
Geology, Geophysics and Environment > 2016 > Vol. 42, no. 1 > 120--121
Geology, Geophysics and Environment > 2016 > Vol. 42, no. 1 > 133--134
Annales Societatis Geologorum Poloniae > 2016 > Vol. 86, No. 3 > 249--264
Geology, Geophysics and Environment > 2016 > Vol. 42, no. 2 > 218--222
2015 IEEE International Electron Devices Meeting (IEDM) > 20.1.1 - 20.1.4