Search results for: M. Waltl
IEEE Transactions on Electron Devices > 2017 > 64 > 5 > 2099 - 2105
IEEE Transactions on Electron Devices > 2017 > 64 > 5 > 2092 - 2098
2017 IEEE International Reliability Physics Symposium (IRPS) > XT-10.1 - XT-10.6
2017 IEEE International Reliability Physics Symposium (IRPS) > XT-11.1 - XT-11.6
2017 IEEE International Reliability Physics Symposium (IRPS) > 3B-5.1 - 3B-5.5
2017 IEEE International Reliability Physics Symposium (IRPS) > 6A-6.1 - 6A-6.6
2017 IEEE International Reliability Physics Symposium (IRPS) > 6A-2.1 - 6A-2.6
Solid-State Electronics > 2016 > 125 > C > 52-62
2016 IEEE International Reliability Physics Symposium (IRPS) > 5A-2-1 - 5A-2-8
2016 IEEE International Reliability Physics Symposium (IRPS) > 5A-1-1 - 5A-1-6
2016 IEEE International Reliability Physics Symposium (IRPS) > XT-2-1 - XT-2-6
2015 IEEE International Electron Devices Meeting (IEDM) > 20.1.1 - 20.1.4
2015 IEEE International Reliability Physics Symposium > XT.2.1 - XT.2.6
2014 IEEE International Electron Devices Meeting > 21.1.1 - 21.1.4