Search results for: E. Kussener
2016 IEEE International Reliability Physics Symposium (IRPS) > 7B-4-1 - 7B-4-7
Microelectronics Reliability > 2015 > 55 > 9-10 > 1592-1599
2015 IEEE International Reliability Physics Symposium > FA.1.1 - FA.1.6
2013 IEEE SENSORS > 1 - 4
2011 IEEE SENSORS Proceedings > 1429 - 1432