Search results for: D. Goguenheim
Microelectronic Engineering > 2013 > 109 > Complete > 168-171
2011 International Electron Devices Meeting > 27.5.1 - 27.5.4
Microelectronics Reliability > 2008 > 48 > 8-9 > 1318-1321
Thin Solid Films > 2008 > 516 > 12 > 4083-4092
Microelectronics Reliability > 2008 > 48 > 3 > 335-341
Microelectronics Reliability > 2007 > 47 > 9-11 > 1373-1377
Microelectronics Reliability > 2007 > 47 > 9-11 > 1322-1329
Microelectronics Reliability > 2005 > 45 > 9-11 > 1370-1375