Search results for: B. Vandevelde
2015 IEEE International Reliability Physics Symposium > 4C.5.1 - 4C.5.10
2012 International Electron Devices Meeting > 18.4.1 - 18.4.4
IEEE Journal of Solid-State Circuits > 2011 > 46 > 1 > 293 - 307
2015 IEEE International Reliability Physics Symposium > 4C.5.1 - 4C.5.10
2012 International Electron Devices Meeting > 18.4.1 - 18.4.4
IEEE Journal of Solid-State Circuits > 2011 > 46 > 1 > 293 - 307