Search results for: V. Cherman
Microelectronics Reliability > 2016 > 59 > C > 108-116
Microelectronics Reliability > 2014 > 54 > 6-7 > 1200-1205
2013 IEEE SENSORS > 1 - 4
Microelectronic Engineering > 2013 > 107 > Complete > 219-222
2012 International Electron Devices Meeting > 18.4.1 - 18.4.4
Microelectronics Reliability > 2012 > 52 > 9-10 > 2228-2234
Microelectronics Reliability > 2012 > 52 > 9-10 > 2272-2277
2012 IEEE International Reliability Physics Symposium (IRPS) > 2E.3.1 - 2E.3.9