Search results for: Tuan-Yu Hung
IEEE Transactions on Device and Materials Reliability > 2015 > 15 > 3 > 437 - 442
Microelectronic Engineering > 2014 > 120 > Complete > 114-120
IEEE Transactions on Device and Materials Reliability > 2014 > 14 > 1 > 484 - 492
Microelectronic Engineering > 2013 > 107 > Complete > 125-129
Microelectronics Reliability > 2012 > 52 > 5 > 794-803
2010 IEEE CPMT Symposium Japan > 1 - 4
IEEE Transactions on Advanced Packaging > 2010 > 33 > 3 > 681 - 689
Microelectronics Reliability > 2008 > 48 > 8-9 > 1149-1154