Search results for: Chan-Yen Chou
IEEE Transactions on Advanced Packaging > 2010 > 33 > 3 > 681 - 689
Microelectronics Reliability > 2008 > 48 > 8-9 > 1149-1154
Microelectronics Reliability > 2007 > 47 > 9-11 > 1658-1662
IEEE Transactions on Advanced Packaging > 2010 > 33 > 3 > 681 - 689
Microelectronics Reliability > 2008 > 48 > 8-9 > 1149-1154
Microelectronics Reliability > 2007 > 47 > 9-11 > 1658-1662