Search results for: Shin-Yueh Yang
Journal of Electronic Materials > 2015 > 44 > 7 > 2497-2506
IEEE Transactions on Components, Packaging and Manufacturing Technology > 2014 > 4 > 7 > 1152 - 1158
Microelectronics Reliability > 2012 > 52 > 5 > 794-803
Microelectronics Reliability > 2011 > 51 > 9-11 > 1757-1761
Thin Solid Films > 2011 > 519 > 22 > 7883-7894
Finite Elements in Analysis & Design > 2011 > 47 > 7 > 635-642
2010 IEEE CPMT Symposium Japan > 1 - 4
Ieee transactions on components and packaging technologies > 2010 > 33 > 4 > 713 - 721
Microelectronics Reliability > 2009 > 49 > 9-11 > 1244-1249
Microelectronics Reliability > 2008 > 48 > 8-9 > 1149-1154