Search results for: X. Zhang
2016 IEEE International Electron Devices Meeting (IEDM) > 36.5.1 - 36.5.4
2015 IEEE SENSORS > 1 - 4
2013 IEEE International Reliability Physics Symposium (IRPS) > SE.8.1 - SE.8.6
2011 International Reliability Physics Symposium > SE.4.1 - SE.4.4
2010 International Electron Devices Meeting > 27.3.1 - 27.3.4