Search results for: Jerome Mitard
SID Symposium Digest of Technical Papers > 52 > 1 > 127 - 130
IEEE Transactions on Nuclear Science > 2017 > 64 > 1-1 > 226 - 232
IEEE Transactions on Device and Materials Reliability > 2016 > 16 > 4 > 541 - 548
physica status solidi (a) > 213 > 11 > 2820 - 2833
IEEE Transactions on Electron Devices > 2016 > 63 > 10 > 4031 - 4037
IEEE Transactions on Electron Devices > 2016 > 63 > 10 > 3830 - 3836
IEEE Electron Device Letters > 2016 > 37 > 9 > 1092 - 1095
IEEE Electron Device Letters > 2016 > 37 > 4 > 482 - 485
IEEE Transactions on Electron Devices > 2016 > 63 > 1 > 265 - 271
IEEE Transactions on Nuclear Science > 2015 > 62 > 6-1 > 2412 - 2416
IEEE Transactions on Nuclear Science > 2015 > 62 > 6-1 > 2725 - 2731
IEEE Transactions on Device and Materials Reliability > 2015 > 15 > 3 > 352 - 358
IEEE Transactions on Electron Devices > 2015 > 62 > 7 > 2078 - 2083
IEEE Transactions on Nuclear Science > 2014 > 61 > 6-1 > 3187 - 3192
IEEE Transactions on Electron Devices > 2014 > 61 > 12 > 3985 - 3990
IEEE Transactions on Electron Devices > 2014 > 61 > 5 > 1307 - 1315