Search results for: H. Liu
IEEE Transactions on Electron Devices > 2016 > 63 > 5 > 2163 - 2168
2015 IEEE International Electron Devices Meeting (IEDM) > 17.8.1 - 17.8.4
2013 IEEE International Electron Devices Meeting > 28.2.1 - 28.2.4
2013 IEEE International Reliability Physics Symposium (IRPS) > 6A.3.1 - 6A.3.7
2012 IEEE International Reliability Physics Symposium (IRPS) > GD.3.1 - GD.3.4