Search results for: A. Thean
IEEE Journal of the Electron Devices Society > 2017 > 5 > 6 > 480 - 484
Solid-State Electronics > 2017 > 128 > C > 109-114
Solid-State Electronics > 2017 > 128 > C > 102-108
2016 IEEE International Reliability Physics Symposium (IRPS) > 6C-1-1 - 6C-1-7
2016 IEEE International Reliability Physics Symposium (IRPS) > MY-4-1 - MY-4-4
2016 IEEE International Reliability Physics Symposium (IRPS) > 5A-3-1 - 5A-3-7
2016 IEEE International Reliability Physics Symposium (IRPS) > 4B-2-1 - 4B-2-7
2016 IEEE International Reliability Physics Symposium (IRPS) > IT-2-1 - IT-2-5
Thin Solid Films > 2016 > 602 > C > 64-67