Search results for: L. Nyns
2015 IEEE International Electron Devices Meeting (IEDM) > 31.1.1 - 31.1.4
Microelectronic Engineering > 2013 > 109 > Complete > 46-49
Microelectronic Engineering > 2013 > 106 > Complete > 81-84
2012 IEEE International Reliability Physics Symposium (IRPS) > 5D.1.1 - 5D.1.10
2011 International Electron Devices Meeting > 13.1.1 - 13.1.4
Microelectronic Engineering > 2011 > 88 > 7 > 1098-1100
Microelectronic Engineering > 2011 > 88 > 7 > 1553-1556
Microelectronic Engineering > 2011 > 88 > 7 > 1557-1559
Microelectronic Engineering > 2009 > 86 > 7-9 > 1807-1811
IEEE Electron Device Letters > 2008 > 29 > 5 > 430 - 433