Search results for: S. Sioncke
2017 IEEE International Reliability Physics Symposium (IRPS) > 2B-3.1 - 2B-3.5
2016 IEEE International Electron Devices Meeting (IEDM) > 33.4.1 - 33.4.4
2015 IEEE International Electron Devices Meeting (IEDM) > 31.1.1 - 31.1.4
2015 IEEE International Electron Devices Meeting (IEDM) > 21.6.1 - 21.6.4
Microelectronic Engineering > 2015 > 147 > C > 180-183
2015 IEEE International Reliability Physics Symposium > 5A.7.1 - 5A.7.6
Microelectronic Engineering > 2015 > 132 > C > 218-225
2014 IEEE International Electron Devices Meeting > 16.5.1 - 16.5.4
2014 IEEE International Electron Devices Meeting > 20.2.1 - 20.2.4
2014 IEEE International Electron Devices Meeting > 34.4.1 - 34.4.4
2014 IEEE International Reliability Physics Symposium > 6A.2.1 - 6A.2.6
2013 IEEE International Electron Devices Meeting > 15.2.1 - 15.2.4