Search results for: A. Mocuta
2017 IEEE International Reliability Physics Symposium (IRPS) > XT-9.1 - XT-9.5
2017 IEEE International Reliability Physics Symposium (IRPS) > EL-1.1 - EL-1.3
2017 IEEE International Reliability Physics Symposium (IRPS) > CR-4.1 - CR-4.6
2016 IEEE International Electron Devices Meeting (IEDM) > 15.3.1 - 15.3.4
2016 IEEE International Electron Devices Meeting (IEDM) > 28.2.1 - 28.2.4
2016 IEEE International Electron Devices Meeting (IEDM) > 25.1.1 - 25.1.4
Springer Proceedings in Physics > Microscopy of Semiconducting Materials > Epitaxy: Silicon-Germanium Alloys > 89-92
IEEE Electron Device Letters > 2016 > 37 > 9 > 1084 - 1087