Search results for: Ghaith Bany Hamad
Journal of Electronic Testing > 2017 > 33 > 5 > 607-620
IEEE Transactions on Nuclear Science > 2017 > 64 > 9 > 2523 - 2530
Microelectronics Reliability > 2015 > 55 > 1 > 238-250
IEEE Transactions on Nuclear Science > 2014 > 61 > 4-1 > 1618 - 1627