Search results for: JD
2009 IEEE International SOC Conference (SOCC) > 407 - 411
IEEE Transactions on Device and Materials Reliability > 2009 > 9 > 2 > 311 - 317
IEEE Transactions on Electron Devices > 2009 > 56 > 4 > 634 - 640
IEEE Transactions on Nuclear Science > 2008 > 55 > 6-1 > 3360 - 3366
IEEE Transactions on Education > 2008 > 51 > 3 > 325 - 330
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2007 > 15 > 6 > 660 - 671
IEEE Transactions on Electron Devices > 2007 > 54 > 7 > 1605 - 1616