Wyniki wyszukiwania
Journal of Electronic Testing > 2019 > 35 > 2 > 191-200
Journal of Electronic Testing > 2017 > 33 > 5 > 637-655
IEEE Transactions on Device and Materials Reliability > 2017 > 17 > 1 > 157 - 162
IEEE Transactions on Nuclear Science > 2016 > 63 > 4-1 > 2087 - 2094
IEEE Transactions on Information Forensics and Security > 2015 > 10 > 12 > 2653 - 2668
IEEE Transactions on Nuclear Science > 2015 > 62 > 4-2 > 1898 - 1904
IEEE Transactions on Nuclear Science > 2015 > 62 > 4-1 > 1599 - 1608
IEEE Transactions on Nuclear Science > 2014 > 61 > 6-1 > 3095 - 3102
IEEE Transactions on Nuclear Science > 2013 > 60 > 3-2 > 1816 - 1823
IEEE Transactions on Nuclear Science > 2012 > 59 > 6-1 > 2824 - 2830
IEEE Transactions on Nuclear Science > 2012 > 59 > 6-1 > 2722 - 2728
IEEE Transactions on Electron Devices > 2012 > 59 > 3 > 807 - 812
IEEE Transactions on Electron Devices > 2012 > 59 > 3 > 800 - 806