Search results for: L. Bolzani Poehls
Journal of Electronic Testing > 2019 > 35 > 2 > 191-200
Microelectronics Reliability > 2016 > 67 > C > 150-158
Journal of Electronic Testing > 2016 > 32 > 3 > 315-328
Journal of Electronic Testing > 2012 > 28 > 6 > 777-789
IEEE Transactions on Dependable and Secure Computing > 2010 > 7 > 4 > 439 - 445