Wyniki wyszukiwania
IEEE Design & Test of Computers > 2011 > 28 > 2 > 16 - 29
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2011 > 19 > 1 > 146 - 151
2009 International Semiconductor Conference > 2 > 435 - 438
IEEE Design & Test of Computers > 2011 > 28 > 2 > 16 - 29
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2011 > 19 > 1 > 146 - 151
2009 International Semiconductor Conference > 2 > 435 - 438