Search results for: Arnaud Virazel
Journal of Electronic Testing > 2017 > 33 > 1 > 25-36
Advanced Test Methods for SRAMs > 133-158
Journal of Electronic Testing > 2016 > 32 > 6 > 721-733
Lecture Notes in Computer Science > Integrated Circuit and System Design. Power and Timing Modeling, Optimization and Simulation > Poster Session 1: Applications > 540-549
Advanced Test Methods for SRAMs > 99-114
Advanced Test Methods for SRAMs > 49-64
Advanced Test Methods for SRAMs > 115-132
Advanced Test Methods for SRAMs > 65-80
Advanced Test Methods for SRAMs > 81-97
Advanced Test Methods for SRAMs > 21-48
Journal of Electronic Testing > 2016 > 32 > 2 > 147-161