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IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2017 > 25 > 9 > 2561 - 2574
IEEE Transactions on Components, Packaging and Manufacturing Technology > 2017 > 7 > 5 > 802 - 805
IEEE Design & Test > 2016 > 33 > 3 > 37 - 45
2016 IEEE International Reliability Physics Symposium (IRPS) > CD-4-1 - CD-4-5
IEEE Transactions on Electron Devices > 2014 > 61 > 9 > 3206 - 3212
2013 IEEE International Electron Devices Meeting > 7.2.1 - 7.2.4
2011 International Reliability Physics Symposium > 6A.4.1 - 6A.4.6
2011 International Reliability Physics Symposium > PL.1.1 - PL.1.5
2011 International Reliability Physics Symposium > CD.1.1 - CD.1.6
2011 International Reliability Physics Symposium > XT.10.1 - XT.10.5
IEEE Transactions on Device and Materials Reliability > 2011 > 11 > 1 > 171 - 178
IEEE Electron Device Letters > 2011 > 32 > 3 > 321 - 323