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IEEE Electron Device Letters > 2010 > 31 > 12 > 1368 - 1370
IEEE Transactions on Device and Materials Reliability > 2010 > 10 > 2 > 295 - 300
IEEE Electron Device Letters > 2010 > 31 > 12 > 1368 - 1370
IEEE Transactions on Device and Materials Reliability > 2010 > 10 > 2 > 295 - 300